The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Jul. 15, 2023
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventors:

Dirk Van Duijn, Katwijk, NL;

Ronald Schrier, Delft, NL;

Frank Edo Bakker, Edam, NL;

Assignee:

HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 9/26 (2006.01);
U.S. Cl.
CPC ...
G01N 9/26 (2013.01);
Abstract

Methods, systems, and devices for measuring density involve performing a buoyancy measurement with respect to a product in a tank and determining a first density based on the buoyancy measurement. A pressure measurement of pressure in the tank is performed, and a second density is determined based on the pressure measurement. An offset of the buoyancy measurement is calculated using the first and second densities, and the offset is applied to correct the first density measured at the predetermined position in the tank.


Find Patent Forward Citations

Van Duijn, Dirk. (2026). Improving accuracy by adding additional sensors to a density measuring system (U.S. Patent No. 12742715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12742715

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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