The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Jul. 15, 2022
Japan Aerospace Exploration Agency, Tokyo, JP;
Hajime Yano, Chofu, JP;
Yoshitsugu Sone, Chofu, JP;
Eiji Hosono, Tsukuba, JP;
Haruo Kishimoto, Tsukuba, JP;
Hirokazu Kitaura, Tsukuba, JP;
Daisuke Asakura, Tsukuba, JP;
Tomohiro Ishiyama, Tsukuba, JP;
Ayaka Takahashi, Chiba, JP;
Minoru Umeda, Nagaoka, JP;
Sayoko Inagawa, Nagaoka, JP;
Abstract
An ionized material sample collection device according to the present invention includes one or a plurality of container's main bodies that each has a surrounding wall and a bottom wall and has a sample entrance in an upper portion of the surrounding wall, a sample impact target that is formed in the bottom portion of each of the container's main bodies, and one or more ionized material collection zones that are formed on at least one of the inner surfaces and the bottom surface of the surrounding wall of each of the container's main bodies. It is preferable that a plurality of the ionized material collection zones be formed on the inner surfaces of the surrounding wall and each of the plurality of ionized material collection zones be an ionized material collection zone which has an affinity for a different element.