The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Jul. 11, 2022
Applicant:

Smc Corporation, Tokyo, JP;

Inventor:

Hiroyuki Okuhira, Tsukubamirai, JP;

Assignee:

SMC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/22 (2006.01); G01M 3/28 (2006.01);
U.S. Cl.
CPC ...
G01M 3/223 (2013.01); G01M 3/2853 (2013.01);
Abstract

An equipment inspection system performs compressed air leakage inspection on a plurality of pieces of pneumatic equipment that are connected to pipes, or pipe joints that connect the respective pipes and the plurality of pieces of pneumatic equipment, has a first branched pipe and a second branched pipe. A flow rate measurement device is provided in the second branched pipe. The flow rate measurement device measures the flow rate of the compressed air flowing in the second branched pipe. A fluorescent solvent providing part is provided in the first branched pipe. A fluorescent solvent is supplied to the pipe from the fluorescent solvent providing part.


Find Patent Forward Citations

Okuhira, Hiroyuki. (2026). Equipment inspection system (U.S. Patent No. 12742698). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12742698

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…