Resistive thermometer excitation and calibration

Abstract

Circuitry and measurement approaches are described herein that can be used to reduce or suppress sensitivity to variation of sensor properties or characteristics over time for a respective monolithically integrated resistive temperature sensor. Such measurement approaches can also help to suppress measurement variations between sensors, such as to provide stable temperature measurement characteristics across locations and over time for the respective different temperature measurement sites on or within the integrated circuit package. The approaches described herein can also reduce or suppress sensitivity to variation in excitation source characteristics, such as using a relative indication (e.g., a ratio) of measured signal values corresponding to a respective temperature sensor and a co-integrated reference device. Calibration or absolute temperature measurements can be performed, such as using an off-chip (e.g., off-die or off-package) calibration reference. The off-chip calibration reference can be used to establish calibration data for other measurements.