The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Apr. 30, 2024
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Vladimir M. Shalaev, West Lafayette, IN (US);

Alexandra Boltasseva, West Lafayette, IN (US);

Colton B. Fruhling, Lafayette, IN (US);

Mustafa Goksu Ozlu, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01J 1/44 (2006.01); H04N 25/71 (2023.01); H04N 25/76 (2023.01);
U.S. Cl.
CPC ...
G01J 1/0407 (2013.01); G01J 1/44 (2013.01); H04N 25/71 (2023.01); H04N 25/76 (2023.01); G01J 2001/4473 (2013.01); G01J 2001/448 (2013.01);
Abstract

A streak camera is disclosed which includes an entrance slit forming a first end of the streak camera, the entrance slit having a width and height, an image capture device forming a second send of the streak camera, and an epsilon-near-zero (ENZ) slab defined by a bandgap energy and plasma frequency disposed within the streak camera, the ENZ slab configured to receive two beams with a predetermined delay therebetween, the two beams include i) a witness beam through the entrance slit at an incident angle θ, and ii) a trigger beam at substantially a normal incident angle, wherein the trigger beam applies energy at a level below the bandgap energy of the ENZ slab to thereby modify refractive index of the ENZ slab, and thus generate a modified witness beam at a time-varying exit angle φ(t) onto the image capture device.


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