The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Dec. 20, 2023
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Yasunori Hiyoshi, Suwa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 1/04 (2006.01); G01P 15/08 (2006.01);
U.S. Cl.
CPC ...
G01D 1/04 (2013.01); G01P 15/0802 (2013.01);
Abstract

A inertial measurement device includes: a first inertial measurement unit to an n-th inertial measurement unit; a relay circuit configured to receive first detection data to n-th detection data from the first inertial measurement unit to the n-th inertial measurement unit and output the first detection data to the n-th detection data as output data in a time-division manner; and a processing device configured to receive the output data from the relay circuit and perform synthesis processing on the first detection data to the n-th detection data.


Find Patent Forward Citations

Hiyoshi, Yasunori. (2026). Inertial measurement device (U.S. Patent No. 12742662). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12742662

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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