The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Sep. 06, 2024
Applicant:

Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;

Inventors:

Qizhi Chen, Ningde, CN;

Zerong Cao, Ningde, CN;

Lin MA, Ningde, CN;

Pengfei Meng, Ningde, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/04 (2006.01); H01M 4/139 (2010.01); H01M 50/54 (2021.01);
U.S. Cl.
CPC ...
G01B 11/043 (2013.01); G01B 11/046 (2013.01); H01M 4/139 (2013.01); H01M 50/54 (2021.01);
Abstract

A dimension measurement apparatus is disclosed, including a carrier plate and a line scan camera. The carrier plate is configured to carry a to-be-measured item. The line scan camera is disposed opposite to the carrier plate along a first direction and configured to photograph the to-be-measured item. The line scan camera is configured to be movable relative to the carrier plate along a second direction, and the first direction is perpendicular to the second direction. The dimension measurement apparatus can improve the shooting efficiency.


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