The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Aug. 07, 2024
Applicants:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Tomocube, Inc., Daejeon, KR;

Inventors:

Yongkeun Park, Daejeon, KR;

Herve Jerome Hugonnet, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01); G01B 9/02091 (2022.01); H04N 13/207 (2018.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/02041 (2013.01); H04N 13/207 (2018.05);
Abstract

Provided is a high-resolution reflection tomographic imaging system and method. The high-resolution reflection tomographic imaging system of the present disclosure may include an objective lens, a tube lens, a camera, an illumination element configured to introduce temporally coherent and spatially incoherent light, and a semi-reflective surface element configured to split the light into a sample and a reference beam between the tube lens and the camera, such that a sample beam from the sample and the reference beam cause interference for tomographic imaging.


Find Patent Forward Citations

Park, Yongkeun. (2026). System and method for high-resolution reflection tomographic imaging (U.S. Patent No. 12742630). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12742630

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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