The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Apr. 17, 2023
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Hui Luo, Marlboro, NJ (US);

Rakesh Taori, McKinnery, TX (US);

Roman Baker, Las Vegas, NV (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 12/104 (2021.01); H04W 12/041 (2021.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 12/104 (2021.01); H04W 12/041 (2021.01); H04W 24/10 (2013.01);
Abstract

A method can include transmitting a request with a request integrity code (IC), receiving a first message at a time t2, executing a validation operation on the first measurement message that includes an operation on at least a portion of the first measurement message with a key. In response to the first measurement message being determined invalid, indicating time t2 as invalid. A second measurement message can be transmitted at a time t3. A third measurement message can be received that includes two remote time values t1 and t4. In response to times t1 to t4 being determined to be valid, a first distance value can be calculated with the times t1 to t4. First and second messages can include ICs generated by executing the operation on the corresponding messages with the key. Corresponding devices and systems are also disclosed.


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