The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Dec. 13, 2022
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventor:

Choudhury A. Al Sayeed, Stittsville, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/00 (2006.01); H04J 14/02 (2006.01); H04Q 11/00 (2006.01);
U.S. Cl.
CPC ...
H04Q 11/0067 (2013.01); H04J 14/02216 (2023.08); H04Q 2011/0081 (2013.01); H04Q 2011/0083 (2013.01);
Abstract

Systems and methods include, responsive for a requirement to calibrate a single span in a multi-span optical line system where the single span includes a from-end node and a to-end node, determining no other upstream node in the multi-span optical multiplex section is currently calibrating or faulted; responsive to no other upstream node currently calibrating or faulted, calibrating the from-end node with a new target launch power into a fiber associated with the single span; and calibrating the to-end node keeping target launch power into a fiber associated with an immediate downstream span from the single span uninterrupted from a previous calibration. The to-end node and the from-end node are each (1) an intermediate line amplifier or (2) a terminal node and an intermediate line amplifier, in the multi-span optical line system.


Find Patent Forward Citations

Loading…