The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Jun. 29, 2023
Applicant:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Inventors:

Connor C. Mcbryde, Cedar Rapids, IA (US);

James B. West, Cedar Rapids, IA (US);

Assignee:

Rockwell Collins, Inc., Cedar Rapids, IA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/00 (2006.01); H01Q 3/26 (2006.01); H01Q 3/28 (2006.01); H01Q 3/36 (2006.01); G01S 7/40 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H01Q 3/28 (2013.01); H01Q 3/36 (2013.01); G01S 7/4004 (2013.01); G01S 7/4086 (2021.05); H01Q 3/26 (2013.01);
Abstract

A calibration system for AESAs induces the AESA to produce a far field radiation pattern while near field measurements are taken; an initial calibration is produced, and complex aperture holograms are calculated. Based on the complex holograms, phase and amplitude error maps are computed. T/R module amplitude and phase are then adjusted to compensate for the error map. The system evaluates the refined far field radiation pattern to iteratively recompute complex aperture excitations to realize adequate far field performance and new hologram error maps until a desired level of precision is reached.


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