The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Nov. 18, 2022
Applicants:

National University Corporation Hokkaido University, Hokkaido, JP;

Osaka University, Osaka, JP;

Inventors:

Sou Ryuzaki, Sapporo, JP;

Rintaro Matsuda, Kanagawa, JP;

Masateru Taniguchi, Osaka, JP;

Yuki Komoto, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16C 20/20 (2019.01); G16C 20/70 (2019.01);
U.S. Cl.
CPC ...
G16C 20/20 (2019.02); G16C 20/70 (2019.02);
Abstract

A method for generating spectral data according to the present invention involves generating spectral data pertaining to a microparticle sample that includes at least one microparticle, wherein: the method includes a step for acquiring a measurement spectrum from microparticles disposed within a through-hole in a substrate; the through-hole has an inclined structure in which the width continuously decreases from one surface of the substrate toward the other surface thereof; at least part of the inner surface of the through-hole is configured from a metal that exhibits plasmon resonance; and in the step for acquiring the measurement spectrum, the measurement spectrum is acquired while the interior of the through-hole is irradiated with light.


Find Patent Forward Citations

Ryuzaki, Sou. (2026). Method for generating spectral data pertaining to microparticle sample, method for analyzing microparticles, method for distinguishing microparticles, method for assessing whether cancer-cell-derived exosomes are present, substrate for measuring spectrum of microparticles, device for measuring spectrum of microparticles, and apparatus for measuring spectrum of microparticles (U.S. Patent No. 12738347). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12738347

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