Semiconductor memory device and method of operating the same

Abstract

Provided herein are a semiconductor memory device and a method of operating the same. The semiconductor memory device may include a memory block including a plurality of memory cells, a voltage generation circuit configured to generate a read voltage and a pass voltage to be applied to word lines of the memory block during a read operation on the memory block, a temperature measurement circuit configured to measure a temperature before or after the read operation is performed, and output a temperature code corresponding to the measured temperature, and a block read counter configured to determine a read count increment of the memory block depending on the read operation based on the temperature code, and to update a read count value for the memory block by adjusting the read count value depending on the read count increment.