The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Mar. 12, 2024
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

De Cai, Shenzhen, CN;

Xiao Han, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06T 7/246 (2017.01); G06V 10/42 (2022.01); G06V 10/44 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 20/695 (2022.01); G06T 7/11 (2017.01); G06T 7/12 (2017.01); G06T 7/246 (2017.01); G06V 10/42 (2022.01); G06V 10/44 (2022.01); G06V 10/77 (2022.01); G06V 20/698 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01);
Abstract

This application discloses a microscopic image processing method performed by a computer device. The method includes: extracting an instance image of a target object from a microscopic image; obtaining skeleton form information of the target object from the instance image, the skeleton form information representing a skeleton form of the target object; performing motion analysis on the target object based on the skeleton form information to obtain a plurality of eigenvalues; and determining an eigenvalue sequence comprising the plurality of eigenvalues as motion component information of the target object.


Find Patent Forward Citations

Cai, De. (2026). Microscopic image processing method and apparatus, computer device, and storage medium (U.S. Patent No. 12738080). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12738080

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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