The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Jul. 30, 2021
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Sota Komatsu, Tokyo, JP;

Masayoshi Ishikawa, Tokyo, JP;

Fumihiro Bekku, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 3/40 (2006.01); G06V 10/44 (2022.01); G06V 10/762 (2022.01); G06V 10/771 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06T 3/40 (2013.01); G06V 10/44 (2022.01); G06V 10/762 (2022.01); G06V 10/771 (2022.01);
Abstract

Provided are an image classification device and method that are capable of extracting and mapping an important feature in an image. The image classification device includes: a feature extraction unitthat generates a first image group generated by applying different noises to the same image among images included in an image group and a second image group including different images, is trained such that features obtained from the first image group are approximate, is trained such that features obtained from the second image group are more different, and extracts features; a feature mapping unitthat maps the extracted plurality of features two-dimensionally or three-dimensionally using manifold learning; and a display unitthat displays a mapping result and constructs a training information application task screen.


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