The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Dec. 01, 2021
Amgen Inc., Thousand Oaks, CA (US);
Al Patrick Goodwin, Dunleer, IE;
Joseph Peter Bernacki, Thousand Oaks, CA (US);
Graham F. Milne, Ventura, CA (US);
Thomas Clark Pearson, Newbury Park, CA (US);
Aman Mahendra Jain, Newbury Park, CA (US);
Jordan Ray Fine, Ventura, CA (US);
Kenneth E. Hampshire, Thousand Oaks, CA (US);
Aik Jun Tan, Boston, MA (US);
Osvaldo Perez Varela, Guaynabo, PR;
Nishant Mukesh Gadhvi, Camarillo, CA (US);
AMGEN INC., Thousand Oaks, CA (US);
Abstract
Various techniques facilitate the development of an image library that can be used to train and/or validate an automated visual inspection (AVI) model, such an AVI neural network for image classification. In one aspect, an arithmetic transposition algorithm is used to generate synthetic images from original images by transposing features (e.g., defects) onto the original images, with pixel-level realism. In other aspects, digital inpainting techniques are used to generate realistic synthetic images from original images. Deep learning-based inpainting techniques may be used to add, remove, and/or modify defects or other depicted features. In still other aspects, quality control techniques are used to assess the suitability of image libraries for training and/or validation of AVI models, and/or to assess whether individual images are suitable for inclusion in such libraries.