The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Mar. 23, 2023
Applicant:

Kyocera Corporation, Kyoto, JP;

Inventor:

Atsushi Yoshikawa, Sagamihara, JP;

Assignee:

KYOCERA Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G01S 7/497 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30232 (2013.01); G06T 2207/30236 (2013.01);
Abstract

An observation apparatus includes a controller. The controller performs calibration based on a feature point set for a first region among the first region, a second region, and a third region and information on a position of the feature point in a real space. The controller acquires information on a position, in the real space, of a predetermined point in an observation region of a first sensor or an observation region of a second sensor. The first region corresponds to both the observation region of the first sensor and the observation region of the second sensor. The second region corresponds to the observation region of the first sensor and does not overlap the first region. The third region corresponds to the observation region of the second sensor and does not overlap the first region.


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