The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Jul. 10, 2025
Dalian University of Technology, Dalian, CN;
Tao Liu, Dalian, CN;
Yongcan Shuang, Dalian, CN;
Ji Fan, Dalian, CN;
Shoulin Hao, Dalian, CN;
Tingman Yan, Dalian, CN;
Luyao Yan, Dalian, CN;
Haibo Niu, Dalian, CN;
DALIAN UNIVERSITY OF TECHNOLOGY, Liaoning, CN;
Abstract
A method for real-time detection of length and width size distribution of a crystal population in a glass crystallizer by binocular telecentric cameras. A calibration pole that can extend into an in-situ environment (reactor/glass tube) is designed; a binocular telecentric stereo vision imaging model is established; a simple calibration method of a rotating calibration pole suitable for an in-situ limited space and a calibration plate design solution are proposed. A simplified telecentric stereo epipolar rectification method is also provided to ensure the accurate matching of in situ snapshot image pairs. A three-dimensional reconstruction method by ray intersection based on analytical solutions is provided to measure the three-dimensional postures of particles in a crystallizer. Finally, the three-dimensional length and width are quantitatively evaluated through the statistical data of the Euclidean distances of length and width feature point pairs of crystals.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile