The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Dec. 14, 2021
Applicant:

Shanghai Percipio Technology Limited, Shanghai, CN;

Inventors:

Minjie Wang, Shanghai, CN;

Yushi Liang, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/22 (2006.01); G01B 11/25 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/254 (2013.01);
Abstract

A depth data computing device and a corresponding method are provided. The computing device includes a projection device for scanning and projecting a set of structured light with different patterns onto a shooting area, and first and second image sensors for capturing the area to obtain image frames under illumination of the structured light for single depth calculation. Each image sensor includes at least a first sub-image sensor and a second sub-image sensor sharing at least part of an optical path, the sub-image sensors successively imaging the structured light of different patterns projected by the projection device. Continuous imaging is performed using multiple binocular configurations, enabling high-frame-rate depth data acquisition.


Find Patent Forward Citations

Wang, Minjie. (2026). Depth data measurement head, depth data computing device, and corresponding method (U.S. Patent No. 12737905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12737905

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…