The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Apr. 28, 2021
Volume Graphics Gmbh, Heidelberg, DE;
Sören Schüller, Heidelberg, DE;
Thomas Günther, Heidelberg, DE;
Daniela Handl, Heidelberg, DE;
Matthias Flessner, Heidelberg, DE;
Christof Reinhart, Heidelberg, DE;
Christoph Poliwoda, Heidelberg, DE;
Sven Gondrom-Linke, Heidelberg, DE;
Volume Graphics GmbH, Heidelberg, DE;
Abstract
Described is measuring an object by: determining measurement data using a device for measuring the object, wherein the measurement data generates a digital representation of the object with image data; and before the determining measurement data has ended: analyzing part of the digital representation to identify defects; if a defect is identified: determining at least one conformity result relating to the analyzed part, the conformity result indicating to what extent the analyzed part with the determined defect fulfils at least one predefined conformity criterion for the object; and if no defect is identified and sufficient measurement data have been acquired to determine that the analyzed part fulfils the at least one conformity criterion: generating a conformity result relating to the analyzed part, the conformity result indicating that the at least one predefined conformity criterion is fulfilled for the object; adapting the step of determining, taking the conformity result into account.