The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Feb. 27, 2024
Canon Kabushiki Kaisha, Tokyo, JP;
Takeyuki Suda, Chiba, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An inspection system includes a reading unit that reads a sheet on which a target image is formed to generate read image data, an inspection unit that inspects the target image by comparing the read image data with a reference image data at an inspection level configured from among candidate levels to generate a first inspection result, and a control unit that causes a display apparatus to display an inspection result. In a case where the first inspection result meets a predetermined condition, the control unit causes the display apparatus to display the first inspection result and to display a second inspection result. The second inspection result is obtained by inspecting the target image at one or more candidate levels that are different from the inspection level.