The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
May. 27, 2025
Google Llc, Mountain View, CA (US);
Jason Weng Wei, Mountain View, CA (US);
Dengyong Zhou, Redmond, WA (US);
Dale Eric Schuurmans, Edmonton, CA;
Quoc V. Le, Sunnyvale, CA (US);
Maarten Paul Bosma, Cupertino, CA (US);
Ed Huai-Hsin Chi, Palo Alto, CA (US);
Olivier Jean Andrè Bousquet, Zürich, CH;
Le Hou, South Setauket, NY (US);
Nathan Kemp Sekiguchi Scales, Baar, CH;
David J. Bieber, New York, NY (US);
Charles Aloysius Sutton, Santa Clara, CA (US);
Nathanael Martin Schärli, Pittsburgh, PA (US);
Augustus Quadrozzi Odena, San Francisco, CA (US);
Sharan Ajit Narang, San Francisco, CA (US);
Guy Gur-Ari Krakover, Palo Alto, CA (US);
Aakanksha Chowdhery, Santa Clara, CA (US);
Aitor Lewkowycz, San Jose, CA (US);
Jiageng Luan, San Francisco, CA (US);
David Martin Dohan, San Francisco, CA (US);
Henryk Michalewski, Oxfordshire, GB;
Jacob Austin, New York, NY (US);
Anders Johan Andreassen, Princeton, NJ (US);
Maxwell Isaac Nye, San Francisco, CA (US);
Xuezhi Wang, New York, NY (US);
GOOGLE LLC, Mountain View, CA (US);
Abstract
An example technique for image analysis is provided. An example image analysis method includes obtaining an instructive sequence descriptive of an instructive query, an instructive response, and an instructive trace of intermediate states from the instructive query to the instructive response. The example image analysis method includes inputting, to a machine-learned model, the instructive sequence and an operative image processing query that comprises image data, wherein the machine-learned model is configured to process the operative query with attention over the instructive sequence. The example method can include generating, using the machine-learned model and responsive to the operative query, an operative image processing response that comprises an analysis of the image data.