The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Dec. 20, 2024
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

Xiangyun Ye, Framingham, MA (US);

Ganesa Rukmani Ramdas Pillai, Natick, MA (US);

Hongyi Fan, Franklin, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/14 (2006.01); G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1417 (2013.01); G06K 7/10722 (2013.01); G06K 7/146 (2013.01);
Abstract

The techniques described herein relate to methods and systems for processing symbols quickly and robustly. The techniques can include using a pre-trained deep learning model to generate a region of interest (ROI) of an image captured by an imaging device according to a set of attributes associated with the imaging device. The techniques can include using a machine learning model to generate a quality metric for the image. The quality metric can indicate a measurement that the ROI of the symbol can be decoded. The set of attributes of the imaging device can be adjusted based on the quality metric before taking another image until a quality metric satisfies predetermined criteria. Such techniques enable fast and robust symbol processing with compact system configurations and easily setup components.


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