The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Dec. 17, 2024
Applicant:

Visa International Service Association, San Francisco, CA (US);

Inventors:

Aadithya Jerome Prabhakar Francis, Cedar Park, TX (US);

Eric Le Saint, Los Altos, CA (US);

Dhruv Manish Gada, Foster City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01);
Abstract

A computer-implemented method includes performing a frequency analysis on unlabeled access data to identify high frequency occurrences and low frequency occurrences in the unlabeled access data; grouping the occurrences into groupings based on the frequency analysis; generating access-data corpora based on the groupings, and an initial dictionary using a similarity algorithm, wherein the initial dictionary is manually created from the unlabeled access data, and wherein the access-data corpora comprise n-gram dictionaries; determining, by an unsupervised natural language processing module, first multi-label classifications for the unlabeled access data, wherein the first multi-label classifications are based on the access-data corpora; determining, by a supervised neural network, second multi-label classifications for the unlabeled access data, wherein the second multi-label classifications are based on the access-data corpora and a manually-labeled subset of the access data; and applying multi-label classifiers to the unlabeled access data based on the first and second multi-label classifications.


Find Patent Forward Citations

Loading…