The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Dec. 09, 2022
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventor:

Xiaoyu Yin, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01);
Abstract

Disclosed are an algorithm test method, an algorithm test platform and a computer-readable storage medium. The test method is applied to an algorithm test platform side and includes the following acts: receiving a test task; analyzing a type and a parameter of the test task, wherein the type of the test task includes at least one of the following: an algorithm model test, an algorithm interface test and an algorithm online operation state test; according to the analyzed type and parameter, performing test preparation and issuing the test task; and receiving a test result, displaying and/or feeding back the test result.


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Yin, Xiaoyu. (2026). Algorithm test method, algorithm test platform, and computer-readable storage medium (U.S. Patent No. 12737285). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12737285

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