The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Feb. 24, 2022
Applicant:

Rtm Inc, Seoul, KR;

Inventors:

Sang Yeop Kim, Seoul, KR;

Jin Woo Park, Seoul, KR;

Assignee:

RTM INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4184 (2013.01); G05B 2219/50065 (2013.01);
Abstract

According to the present disclosure, a method of extracting a feature of measurement data using a computing apparatus may include identifying measurement data obtained during a process, identifying target data related to the measurement data, performing a computation on the measurement data based on the target data, extracting a plurality of first values by applying a max pooling layer to the computed measurement data, extracting a plurality of second values by applying a min pooling layer to the computed measurement data, and extracting a plurality of third values related to a feature of the measurement data using the plurality of first values and the plurality of second values.


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