The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
May. 26, 2022
Seiko Epson Corporation, Tokyo, JP;
Nobuhito Hayashi, Chino, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
A laser interferometer that includes a laser light source configured to emit emission light, a light splitter configured to split the emission light into first split light, and second split light incident on an object to be measured, a light modulator disposed on an optical path on which the first split light advances, and configured to modulate the first split light into a reference light having a different frequency from a frequency of the first split light, an optical path length change unit provided between the light splitter and the light modulator, and configured to change a first optical path length, the first optical path length being an optical path length between the light splitter and the light modulator, a photoreceptor configured to receive an interference light of the reference light and an object light generated by reflecting the emission light at the object to be measured, and to output a light reception signal, and a controller configured to control operation of the optical path length change unit in accordance with a second optical path length, the second optical path length being an optical path length between the light splitter and the object to be measured.