The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Nov. 01, 2024
Applicant:

Evident Corporation, Tatsuno-machi, JP;

Inventors:

Kentaro Yamazaki, Kamiina-gun, JP;

Kenji Kawasaki, Kamiina-gun, JP;

Kenichi Kusaka, Kamiina-gun, JP;

Izumi Shomura, Kamiina-gun, JP;

Assignee:

Evident Corporation, Kamiina, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/368 (2013.01); G02B 21/0032 (2013.01); G02B 21/0044 (2013.01);
Abstract

An observation apparatus includes a display apparatus that displays a display pattern, a display projection optical system that projects a light beam from the display apparatus and forms an image of the display pattern, a combining optical element that combines a light beam from a sample and the light beam from the display apparatus, and an eyepiece optical system through which an image of the sample and an image of the display pattern are simultaneously observable by an observer. A numerical aperture (NA) of the light beam from the display apparatus is smaller than a maximum value and larger than a minimum value of an NA of the light beam from the sample, at a position of an image on an optical path that is formed after the light beams from the sample and the display apparatus are combined by the combining optical element.


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