The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Dec. 07, 2023
Carl Zeiss Meditec Ag, Jena, DE;
David Reichert, Vienna, AT;
Marco Wilzbach, Rainau, DE;
Stefan Saur, Aalen, DE;
Christoph Hauger, Aalen, DE;
Artur Hoegele, Oberkochen, DE;
Mikael Timo Erkkilä, Vienna, AT;
Holger Matz, Unterschneidheim, DE;
Rainer Leitgeb, Vienna, AT;
Angelika Unterhuber, Vienna, AT;
Marco Andreana, Vienna, AT;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for operating a microscopy system includes irradiating a region segment of a first region by a light source with light at a first wavelength λ1 and a first luminous intensity L1, determining a substance-specific parameter within the region segment as a response to being irradiated by the light source, and repeating the steps for all region segments within the first region. In addition, the disclosure relates to a microscopy system, and a calibration method for a microscopy system.