The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Aug. 21, 2023
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Russell A. Budd, North Salem, NY (US);
Jason S. Orcutt, Katonah, NY (US);
Eric Zhang, Sleepy Hollow, NY (US);
Yves Martin, Ossining, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); B23K 26/03 (2006.01); B23K 26/064 (2014.01); B23K 26/067 (2006.01); B23K 26/351 (2014.01); B23K 26/70 (2014.01); G02B 21/08 (2006.01); H10N 60/01 (2023.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); B23K 26/032 (2013.01); B23K 26/0643 (2013.01); B23K 26/0648 (2013.01); B23K 26/067 (2013.01); B23K 26/351 (2015.10); B23K 26/705 (2015.10); G02B 21/082 (2013.01); H10N 60/0884 (2023.02); H10N 60/0912 (2023.02);
Abstract
An optical microscope device comprises an optically integrated configuration of components for imaging a target device within a field of view of the optical microscope device, and for laser annealing the target device by generating a laser beam spot pattern from a laser beam received on an optical fiber from a remote laser source, and for controlling a duration of exposure of the laser beam spot pattern for laser annealing the target device.