The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Aug. 14, 2025
Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;
Jiangjie Zhang, Beijing, CN;
Zhitao Yu, Beijing, CN;
Hongwei Gao, Beijing, CN;
Linong Liu, Beijing, CN;
Abstract
Provided are a Fresnel zone picking model and training method therefor, and a diffraction wave imaging method based on machine learning. The training method includes acquiring seismic wave training data; labeling a Fresnel zone label for the set of horizontal slice images of the initial 3D dip-angle gathers to obtain a set of true labels; inputting the set of horizontal slice images and the set of true labels of the initial 3D dip-angle gathers into a pre-constructed Fresnel zone picking model for iterative training, so as to obtain a prediction result of the Fresnel zone; and updating parameters of the Fresnel zone picking model for each training based on the true label of the Fresnel zone and a loss value of the prediction result until a preset iteration condition is reached. The diffraction wave imaging method performs the diffraction wave imaging by using the trained Fresnel zone picking model.