The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Sep. 08, 2021
Applicant:

Valeo Schalter Und Sensoren Gmbh, Bietigheim-Bissingen, DE;

Inventor:

Nicolas Jecker, Bietigheim-Bissingen, DE;

Assignee:

Valeo Schalter und Sensoren GmbH, Bietigheim-Bissingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 15/931 (2020.01); G01S 7/539 (2006.01); G08G 1/16 (2006.01); B60W 30/06 (2006.01); G01S 15/46 (2006.01);
U.S. Cl.
CPC ...
G01S 15/931 (2013.01); G01S 7/539 (2013.01); G08G 1/168 (2013.01); B60W 30/06 (2013.01); B60W 2420/54 (2013.01); B60W 2554/801 (2020.02); G01S 2015/465 (2013.01); G01S 2015/932 (2013.01); G01S 2015/937 (2013.01);
Abstract

An ultrasonic measuring method involves activating an ultrasonic transceiver at a multiplicity of transmission/reception positions along a lateral direction to transmit a respective transmission signal in a transverse direction and receive a respective received signal waveform. Echo signals in the respective received signal waveform are identified and a set of reflection points are formed by trilaterating a respective reflection point multiple times based on two respective received signal waveforms and a respective echo signal from each of the two received signal waveforms. Multiple pairs made of a primary reflection point and a secondary reflection point are formed, identified on the basis of a position-based criterion as reflection points of a direct and/or indirect reflection from the same object section. An object height at one of the reflection points is characterized as high or low.


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