The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Dec. 21, 2022
Applicant:

Battelle Memorial Institute, Columbus, OH (US);

Inventors:

Rebekah Cross, Columbus, OH (US);

Philip P. Cheney, Bexley, OH (US);

Assignee:

Battelle Memorial Institute, Columbus, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 11/10 (2006.01);
U.S. Cl.
CPC ...
G01S 11/10 (2013.01);
Abstract

In an approach to extracting satellite Doppler curves from waterfall spectrograms, a system includes one or more computer processors; one or more non-transitory computer readable storage media; and program instructions stored on the one or more non-transitory computer readable storage media for execution by at least one of the one or more computer processors. The stored program instructions include instructions to receive satellite data; remove a first noise from the satellite data; agglomerate the satellite data into one or more clusters using adaptive clustering; fit a Doppler curve model to each cluster of the one or more clusters; remove noise clusters from the one or more clusters based on a second noise; and determine one or more orbital elements of a satellite for each remaining cluster of the one or more clusters.


Find Patent Forward Citations

Cross, Rebekah. (2026). System and method to extract satellite doppler curves from waterfall spectrograms data (U.S. Patent No. 12736650). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12736650

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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