The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Sep. 03, 2024
Fujifilm Corporation, Tokyo, JP;
Tomoki Amemiya, Tokyo, JP;
Atsuro Suzuki, Tokyo, JP;
Yukio Kaneko, Tokyo, JP;
Suguru Yokosawa, Tokyo, JP;
Toru Shirai, Tokyo, JP;
Hiroki Shoji, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An MRI apparatus includes a measurement point determination unit that determines each measurement point of three-dimensional k-space data. In a case where a kx direction of a three-dimensional k-space is set as a readout direction, for a plurality of measurement points on a ky-kz plane, the measurement point determination unit adjusts a first condition that an angle of a straight line connecting the measurement points and a center of the plane changes with a golden angle (α) and a distance (r) from a center point of the plane monotonically increases, and determines the measurement point to satisfy a second condition that a change in a position of the measurement point is to be non-periodicity.