The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Feb. 09, 2022
Integral Geometry Science Inc., Hyogo, JP;
Shogo Suzuki, Hyogo, JP;
Yutaro Nishimura, Hyogo, JP;
Yuki Mima, Hyogo, JP;
Kenjiro Kimura, Hyogo, JP;
Noriaki Kimura, Hyogo, JP;
INTEGRAL GEOMETRY SCIENCE INC., Hyogo, JP;
Abstract
The inspecting device is an inspecting device that generates a spatial distribution image of an electric field, the inspecting device including: an electric field obtainer that measures the spatial distribution of the electric field at at least one measurement position determined relative to a scanning position, outside an object that emits the electric field; a scanner, by scanning the electric field obtainer, that obtains a measurement result of the spatial distribution of the electric field at a plurality of measurement positions determined relative to a plurality of scanning positions; and a calculator that calculates the spatial distribution of the electric field in a region including a surface of the object using the measurement result of the spatial distribution of the electric field as a boundary condition, and generates the spatial distribution image that shows the spatial distribution that has been calculated.