The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Apr. 24, 2024
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Johannes Steffens, Munich, DE;

Matthias Ruengeler, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0864 (2013.01);
Abstract

A test and/or measurement system includes a signal generator circuit, wherein the signal generator circuit includes a processing circuit. The processing circuit is configured to generate and/or process a predetermined waveform, wherein the predetermined waveform includes at least one critical portion. The processing circuit is configured to control the signal generator circuit to generate a radio frequency, RF, signal, based on the predetermined waveform, wherein the generated RF signal includes the predetermined waveform. The processing circuit is configured to adapt operational parameters of the signal generator circuit such that a signal level of the at least one critical portion of the RF signal generated fulfills at least one predefined criterion.


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