The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Jul. 12, 2023
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Mohamed Rahmane, Ballston Lake, NY (US);

Andrey I. Meshkov, Niskayuna, NY (US);

Vladimir A. Lobastov, Waterford, NY (US);

William R. Ross, Kinderhook, NY (US);

Assignee:

General Electric Company, Evendale, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); G01N 23/046 (2018.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); B29C 64/393 (2017.08); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 2223/646 (2013.01);
Abstract

The present disclosure is directed to an additive manufacturing system configured to generate an electron beam directed toward a target to generate x-ray flux. The x-ray flux is directed toward the component through at least one plate with a pinhole. Interactions between the component and the x-ray flux generate x-ray radiation. The at least one detector is configured to detect the x-ray radiation through a pinhole. An analysis component is configured to generate an image comprising a three-dimensional component based on the x-ray radiation detected by the at least detector.


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