The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Sep. 21, 2022
Boe Technology Group Co., Ltd., Beijing, CN;
Bo Wang, Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
A color diffraction test device and a test method thereof, and a color diffraction test system are disclosed. The color diffraction test device includes: an objective table configured to drive, during a test, a sample to be tested to rotate in a plane where the objective table is located, where a rotation axis of the objective table is a perpendicular bisector of the objective table, and a test point of the sample to be tested is on the perpendicular bisector of the objective table; a light source configured to irradiate the sample to be tested, where an orthographic projection of a light spot center of the light source on the objective table coincides with a center of the objective table; and a measurement instrument located on a same side of the objective table as the light source.