The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Jul. 09, 2024
Horiba Advanced Techno, Co., Ltd., Kyoto, JP;
Keisuke Sasai, Kyoto, JP;
Issei Kobayashi, Kyoto, JP;
Kazuhiro Irie, Kyoto, JP;
Wataru Kinoshita, Kyoto, JP;
HORIBA Advanced Techno, Co., Ltd., Kyoto, JP;
Abstract
A measurement instrument comprises a cylindrical cell that stores a measurement fluid, a drive mechanism that rotates the cell about a central axis, a first light source that is arranged outside the cell and irradiates the measurement fluid with first inspection light, a second light source that is arranged outside the cell and at a position different from the first light source in a rotation direction of the cell, and irradiates the measurement fluid with second inspection light, a detector that is arranged outside the cell and detects transmitted light of the first inspection light transmitted through the measurement fluid and scattered light of the second inspection light scattered by the measurement fluid, and a cleaning mechanism that is arranged inside the cell and comes into contact with and clean an inner peripheral surface of the cell.