The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Apr. 11, 2024
Applicant:

Dongwoo Fine-chem Co., Ltd., Jeollabuk-do, KR;

Inventors:

Sung Ho Baek, Jeollabuk-do, KR;

Gi Hwan Ahn, Jeollabuk-do, KR;

Min Ju Lee, Jeollabuk-do, KR;

Tae Yong Kim, Jeollabuk-do, KR;

Soo Yeong Lim, Jeollabuk-do, KR;

Su Young Choi, Jeollabuk-do, KR;

Min Gi Hwang, Jeollabuk-do, KR;

Assignee:

DONGWOO FINE-CHEM CO., LTD., Jeollabuk-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/0205 (2024.01); G01N 15/00 (2024.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 2015/0038 (2013.01);
Abstract

In a method for estimating nanoparticles in a solution, a laser-induced plasma is generated by making a pulsed laser beam incident on inside a cell containing a solution, feedback signals is acquired based on light, shock wave and sound generated by the laser-induced plasma, the feedback signals, an intensity of the laser incident on the cell, and intensities of each laser passing through the cell for each laser pulse are acquired, the feedback signals acquired for each laser pulse, the intensity of the laser, and the intensities of the lasers passing through the cell into a pre-trained nanoparticle estimation model is input to estimate sizes or types of unknown nanoparticles included in the solution.


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