The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Oct. 26, 2022
China National Petroleum Corporation, Beijing, CN;
Cnpc Engineering Technology R&d Company Limited, Beijing, CN;
Jiyun Shen, Beijing, CN;
Hongfei Ji, Beijing, CN;
Xueli Guo, Beijing, CN;
Jianzhou Jin, Beijing, CN;
Yongjin Yu, Beijing, CN;
Congfeng Qu, Beijing, CN;
Fengzhong Qi, Beijing, CN;
Zhao Huang, Beijing, CN;
Xiujian Xia, Beijing, CN;
Huiting Liu, Beijing, CN;
Yongqin Cheng, Beijing, CN;
Pengyang Jia, Beijing, CN;
Zhengyang Zhao, Beijing, CN;
CHINA NATIONAL PETROLEUM CORPORATION, Beijing, CN;
CNPC ENGINEERING TECHNOLOGY R&D COMPANY LIMITED, Beijing, CN;
Abstract
A set cement mechanical property parameter measurement method and apparatus based on image recognition technology. The method includes: acquiring a first image of a set cement specimen; extracting at least one feature point in the first image; acquiring a second image of the set cement specimen, the second image being an image of the set cement specimen subjected to a compressive load during a compressive test; determining a deformation gradient of the feature point by positions of the same feature point in the first image and the second image; determining a strain tensor by the deformation gradient; and determining a Young's modulus parameter and a Poisson's ratio parameter by the strain tensor. The method can reduce the measurement period of the Young's modulus and Poisson's ratio of the set cement specimens, simplify the corresponding operation process, and reduce the corresponding measurement error.