The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

Jun. 27, 2024
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Masahiro Yamaguchi, Tokyo, JP;

Kyota Higa, Tokyo, JP;

Yusuke Nonaka, Kanagawa, JP;

Hideo Saito, Kanagawa, JP;

Hideaki Uchiyama, Kanagawa, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 7/04 (2006.01); G01C 21/36 (2006.01);
U.S. Cl.
CPC ...
G01C 7/04 (2013.01); G01C 21/3667 (2013.01);
Abstract

A road surface abnormality detection apparatus includes a data acquisition unit, a prediction unit, and an abnormality detection unit. The data acquisition unit acquires road surface observation data obtained by observing a road surface in a chronological order. The prediction unit predicts road surface data at a first timing from a plurality of road surface observation data at a plurality of respective timings earlier than the first timing by using a trained model generated in advance through machine learning. The abnormality detection unit detects, when a difference between road surface observation data at the first timing and the predicted road surface data at the first timing is equal to or larger than a predetermined threshold, an abnormality of the road surface.


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