The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Sep. 15, 2023
Tesa Sàrl, Renens, CH;
Beat Aebischer, Heerbrugg, CH;
Shiyao Bergamaschini, Puidoux, CH;
Christian De Graffenried, Attalens, CH;
Julien Chardonnens, Bulle, CH;
Davide Manetti, Pully, CH;
Sepide Azhdari, Ecublens, CH;
TESA SÀRL, Renens, CH;
Abstract
A method of calibrating a coordinate measuring machine in which the immutable parameters of the articulated probe head are determine and stored at factory, while the connection parameters and other parameters dependent on the configuration of the system are determined in-situ, with a calibration artifact. The process builds a mathematical model that is the composition of an immutable factory-determined model with the in-situ model. The immutable model can be stored in a non-volatile memory physically provided in the articulated head. The method can fall back to a correction look up table for certain selected orientations of the probe where improved accuracy is needed.