The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Jun. 06, 2024
Applicant:
Canon Production Printing Holding B.v., Venlo, NL;
Inventor:
Bernhard Hochwind, Munich, DE;
Assignee:
Canon Production Printing Holding B.V., Venlo, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); B41J 2/045 (2006.01); B41J 2/165 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 2/2142 (2013.01); B41J 2/0451 (2013.01); B41J 2/16579 (2013.01); B41J 29/393 (2013.01);
Abstract
A test pattern is described for detecting an impaired nozzle of an inkjet printing device. The test pattern has a matrix with matrix points. The columns of the matrix differ from one another such that a lateral offset of up to ±V columns can be detected and compensated for due to the differently designed columns. An impaired nozzle can thus be particularly reliably and robustly detected.
Hochwind, Bernhard. (2026). Test pattern for compensating for a lateral offset in the detection of an impaired nozzle (U.S. Patent No. 12734827). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12734827
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile