The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

May. 28, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Yuta Namiki, Yamanashi, JP;

Yuutarou Takahashi, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/00 (2006.01); B25J 9/16 (2006.01); B25J 19/02 (2006.01); G05B 19/409 (2006.01); G05B 19/42 (2006.01);
U.S. Cl.
CPC ...
B25J 9/0081 (2013.01); B25J 19/023 (2013.01);
Abstract

Provided is a teaching device that is used to create a program for measuring, with a visual sensor, markers installed in a work space, the teaching device comprising a user interface creation unit that creates a user interface for inputting setting information pertaining to the measurement of a marker, wherein the user interface creation unit makes it possible to use first setting information input for a first marker in settings for a second marker in the user interface.


Find Patent Forward Citations

Namiki, Yuta. (2026). Teaching device, marker measuring method, and program (U.S. Patent No. 12734678). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12734678

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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