The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Aug. 06, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Vinay Chande, San Diego, CA (US);

Jing Sun, San Diego, CA (US);

Arumugam Chendamarai Kannan, San Diego, CA (US);

Giovanni Chisci, San Diego, CA (US);

Siyi Chen, Beijing, CN;

Mohammed Ali Mohammed Hirzallah, San Marcos, CA (US);

Aleksandar Damnjanovic, Del Mar, CA (US);

Xiaoxia Zhang, San Diego, CA (US);

Tao Luo, San Diego, CA (US);

Assignee:

QUALCOMM Incorportated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 48/16 (2009.01); H04W 74/0808 (2024.01);
U.S. Cl.
CPC ...
H04W 48/16 (2013.01); H04W 74/0808 (2013.01);
Abstract

Certain aspects of the present disclosure provide techniques for determining if a first sensing beam is eligible for use in channel sensing by a device under test (DUT) for at least a first transmission beam, generally including evaluating the first sensing beam against eligibility criterion based on measurement of sensing gain for the first sensing beam in multiple directions and declaring the first sensing beam eligible for channel sensing for the first transmission beam when the first sensing beam satisfies the eligibility criterion.


Find Patent Forward Citations

Chande, Vinay. (2026). Criterion and conformance test for eligibility of sensing beams for channel access (U.S. Patent No. 12732900). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12732900

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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