The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Jan. 27, 2025
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventors:

Luis Eduardo García Capel, Singapore, SG;

Bo Mu, San Jose, CA (US);

Kamal Rana, San Jose, CA (US);

Assignee:

OMNIVISION TECHNOLOGIES, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 25/47 (2023.01); G06T 1/00 (2006.01); G06T 5/70 (2024.01); G06T 5/73 (2024.01); H04N 23/81 (2023.01); H04N 25/707 (2023.01);
U.S. Cl.
CPC ...
H04N 25/47 (2023.01); G06T 1/0007 (2013.01); G06T 5/70 (2024.01); G06T 5/73 (2024.01); H04N 23/81 (2023.01); H04N 25/707 (2023.01);
Abstract

The present disclosure relates to an image system with performance-driven automatic event sensor control. The image system comprises a hybrid image sensor and control circuitry. The hybrid image sensor comprises an event driven sensing array and a pixel array. The event driven sensing array includes a plurality of event vision sensor (EVS) pixels arranged in EVS pixel rows. Each EVS pixel of the plurality of EVS pixels is configured to capture EVS data corresponding to contrast information of light incident on that EVS pixel. The pixel array includes a plurality of CMOS image sensor (CIS) pixels arranged in CIS pixel rows. Each CIS pixel of the plurality of CIS pixels is configured to capture CIS data corresponding to intensity of light incident on the CIS pixel. The control circuitry is configured to perform operations comprising: generating metrics based on the EVS data and the CIS data, loading metric weights for each metric from registers, building a cost function by combining the metric weights with the metrics, and optimizing a sensor setting of the event driven sensing array by repeatedly changing the sensor setting to obtain a specific value of the sensor setting that maximizes or minimizes the cost function.


Find Patent Forward Citations

Loading…