The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Sep. 14, 2021
Molecular Devices, Llc, San Jose, CA (US);
Avrum Cohen, San Jose, CA (US);
Steven Luke, San Jose, CA (US);
Dihui Hong, San Jose, CA (US);
Loren Stauffer, San Jose, CA (US);
Molecular Devices, LLC, San Jose, CA (US);
Abstract
A method and system of operating a microscopy system are disclosed. A first image first image of a sample acquired using a first imaging configuration is received. A second image is developed from the first image, wherein the second image is associated with a second imaging configuration. A sequence of image processing steps is applied to the first image to develop a first classification of first objects represented in the first image and to the second image to develop a second classification of second objects represented in the second image. A score associated with the second imaging configuration is developed that represents a difference between the first classification and the second classification. The image acquisition time or component requirements of operating the microscopy system is less when operated using the second imaging configuration than when operated using the first imaging configuration.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile