The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Oct. 16, 2024
Applicant:
Ciena Corporation, Hanover, MD (US);
Inventors:
Sebastien Gareau, Ottawa, CA;
Jeffery Thomas Nichols, Marietta, GA (US);
Assignee:
Ciena Corporation, Hanover, MD (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 27/36 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0071 (2013.01); H04L 1/0008 (2013.01); H04L 1/0041 (2013.01); H04L 1/0045 (2013.01); H04L 1/005 (2013.01); H04L 1/0058 (2013.01); H04L 1/0061 (2013.01); H04L 27/362 (2013.01); H04L 1/0064 (2013.01); H04L 1/0082 (2013.01);
Abstract
An apparatus for marking errors in FlexO/ZR data includes circuitry configured to receive an Open Forward Error Correction (OFEC) block, decode a plurality of checksums in a payload area of the OFEC block, detect errors in the payload area based on the decoded plurality of checksums, and mark the detected errors in the payload area. The plurality of checksums are added during adaptation of the FlexO/ZR data to the OFEC block.
Gareau, Sebastien. (2026). Openfec error marking (U.S. Patent No. 12732306). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12732306
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile