The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2026
Filed:
Sep. 14, 2023
Siemens Healthcare Gmbh, Erlangen, DE;
Alois Regensburger, Poxdorf, DE;
Michael Manhart, Fürth, DE;
Siemens Healthineers AG, Forchheim, DE;
Abstract
The invention relates to a method for identifying a change in truncation of an examination object between first projection photographs of the examination object generated by a CT apparatus, and second projection photographs of the examination object generated by the CT apparatus, comprising the following steps to be carried out by a control facility. Receiving a first dataset, comprising the first projection photographs of the examination object; receiving a second dataset, comprising the second projection photographs of the examination object; correlating the first dataset with the second dataset; establishing the change in truncation of the examination object between the first projection photographs and the second projection photographs when satisfaction of at least one predefined change criterion between the datasets is captured; and outputting a predetermined output signal when the change in truncation between the first projection photographs and the second projection photographs is established.